Siegel et al. 2000

Siegel, Jeff & Sandeman, Barbara & Corne, Chris. 2000. Predicting substrate influence : tense-modality-aspect marking in Tayo. In Siegel, Jeff (ed.), Processes of language contact : studies from Australia and the South Pacific, 75-97. Saint-Laurent: Fides.

@incollection{1405,
  address        = {Saint-Laurent},
  author         = {Siegel, Jeff & Sandeman, Barbara & Corne, Chris},
  booktitle      = {Processes of language contact : studies from Australia and the South Pacific},
  editor         = {Siegel, Jeff},
  pages          = {75-97},
  publisher      = {Fides},
  title          = {Predicting substrate influence : tense-modality-aspect marking in Tayo},
  year           = {2000},
  Full_reference = {Siegel, Jeff  : Sandeman, Barbara  : Corne, Chris  : Predicting substrate influence : tense-modality-aspect marking in Tayo --- Source: Processes of language contact : studies from Australia and the South Pacific  / [Ed. by] Jeff Siegel --- Saint-Laurent : Fides, 2000, 75-97},
  LaTeX_cite_key = {Siegeletal2000},
  Language_codes = {CKS}
}